An efficient diagnosis march-based algorithm for coupling faults in SRAM

W. Z W Hasan, I. Halin, S. Shafie, M. Othman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents an applying of march test algorithms to diagnose coupling faults (CFs) of SRAMs memories. Two phases of test algorithm is used to identify all the CFs. At Phase 1 march Cd is used to detect and diagnosis partially of the CFs. The March Distinguish Algorithm (MDA) is used in phase 2 to identify the identical fault syndromes which cannot be identified by the march Cd. Therefore, the proposed test algorithms which (13N 3N/4N) read/write operations for a bit-oriented SRAM can achieve full diagnose.

Original languageEnglish
Title of host publication2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts
Pages198-201
Number of pages4
DOIs
Publication statusPublished - 2011
Externally publishedYes
Event2011 IEEE Regional Symposium on Micro and Nano Electronics, RSM 2011 - Kota Kinabalu, Sabah
Duration: 28 Sep 201130 Sep 2011

Other

Other2011 IEEE Regional Symposium on Micro and Nano Electronics, RSM 2011
CityKota Kinabalu, Sabah
Period28/9/1130/9/11

Fingerprint

Static random access storage
Data storage equipment

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Hasan, W. Z. W., Halin, I., Shafie, S., & Othman, M. (2011). An efficient diagnosis march-based algorithm for coupling faults in SRAM. In 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts (pp. 198-201). [6088323] https://doi.org/10.1109/RSM.2011.6088323

An efficient diagnosis march-based algorithm for coupling faults in SRAM. / Hasan, W. Z W; Halin, I.; Shafie, S.; Othman, M.

2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts. 2011. p. 198-201 6088323.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hasan, WZW, Halin, I, Shafie, S & Othman, M 2011, An efficient diagnosis march-based algorithm for coupling faults in SRAM. in 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts., 6088323, pp. 198-201, 2011 IEEE Regional Symposium on Micro and Nano Electronics, RSM 2011, Kota Kinabalu, Sabah, 28/9/11. https://doi.org/10.1109/RSM.2011.6088323
Hasan WZW, Halin I, Shafie S, Othman M. An efficient diagnosis march-based algorithm for coupling faults in SRAM. In 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts. 2011. p. 198-201. 6088323 https://doi.org/10.1109/RSM.2011.6088323
Hasan, W. Z W ; Halin, I. ; Shafie, S. ; Othman, M. / An efficient diagnosis march-based algorithm for coupling faults in SRAM. 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts. 2011. pp. 198-201
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