An analysis on structural and optical properties of ZnxCd 1-XS thin film deposited by RF magnetron sputtering

M. S. Hossain, M. A. Islam, M. Aliyu, Saleem H. Zaidi, T. Razykov, Kamaruzzaman Sopian, Nowshad Amin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

The compositional, crystal and microstructural, optical transmission and absorption properties of ZnxCd1-xS thin films at low zinc (Zn) content (x=0.2) fabricated by RF co-sputtering using CdS and ZnS were investigated. These ternary compounds were characterized by energy dispersive X-ray analysis (EDX) for composition, X-ray diffraction (XRD) for crystal structure, UV-vis for optical study, forced emission scanning electron microscopy (FESEM) for surface morphology and atomic force microscopy (AFM) for surface topology. XRD patterns of ZnxCd1-xS thin films showed the hexagonal structure with a strong reflection peak of (002) plane. From FESEM, the average grain size smaller than 40 nm was observed. Band gap of the films was determined to be 2.6 eV. The average and root mean square roughness of ZnxCd1-xS (for x= 0.2) were checked by atomic force microscopy (AFM). The surface of the thin films was found to be smoother, homogenous and densely packed with uniform growth.

Original languageEnglish
Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
Pages156-159
Number of pages4
DOIs
Publication statusPublished - 2012
Event38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX
Duration: 3 Jun 20128 Jun 2012

Other

Other38th IEEE Photovoltaic Specialists Conference, PVSC 2012
CityAustin, TX
Period3/6/128/6/12

Fingerprint

Magnetron sputtering
Structural properties
Optical properties
Thin films
Atomic force microscopy
X ray diffraction
Scanning electron microscopy
Energy dispersive X ray analysis
Light transmission
Light absorption
Diffraction patterns
Surface morphology
Sputtering
Energy gap
Zinc
Crystal structure
Surface roughness
Topology
Crystals
Chemical analysis

Keywords

  • Absorption
  • co-sputtering
  • EDX
  • thin films
  • ZnCdS

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

Cite this

Hossain, M. S., Islam, M. A., Aliyu, M., Zaidi, S. H., Razykov, T., Sopian, K., & Amin, N. (2012). An analysis on structural and optical properties of ZnxCd 1-XS thin film deposited by RF magnetron sputtering. In Conference Record of the IEEE Photovoltaic Specialists Conference (pp. 156-159). [6317590] https://doi.org/10.1109/PVSC.2012.6317590

An analysis on structural and optical properties of ZnxCd 1-XS thin film deposited by RF magnetron sputtering. / Hossain, M. S.; Islam, M. A.; Aliyu, M.; Zaidi, Saleem H.; Razykov, T.; Sopian, Kamaruzzaman; Amin, Nowshad.

Conference Record of the IEEE Photovoltaic Specialists Conference. 2012. p. 156-159 6317590.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hossain, MS, Islam, MA, Aliyu, M, Zaidi, SH, Razykov, T, Sopian, K & Amin, N 2012, An analysis on structural and optical properties of ZnxCd 1-XS thin film deposited by RF magnetron sputtering. in Conference Record of the IEEE Photovoltaic Specialists Conference., 6317590, pp. 156-159, 38th IEEE Photovoltaic Specialists Conference, PVSC 2012, Austin, TX, 3/6/12. https://doi.org/10.1109/PVSC.2012.6317590
Hossain MS, Islam MA, Aliyu M, Zaidi SH, Razykov T, Sopian K et al. An analysis on structural and optical properties of ZnxCd 1-XS thin film deposited by RF magnetron sputtering. In Conference Record of the IEEE Photovoltaic Specialists Conference. 2012. p. 156-159. 6317590 https://doi.org/10.1109/PVSC.2012.6317590
Hossain, M. S. ; Islam, M. A. ; Aliyu, M. ; Zaidi, Saleem H. ; Razykov, T. ; Sopian, Kamaruzzaman ; Amin, Nowshad. / An analysis on structural and optical properties of ZnxCd 1-XS thin film deposited by RF magnetron sputtering. Conference Record of the IEEE Photovoltaic Specialists Conference. 2012. pp. 156-159
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