An alternative approach to measures the application of dispatching rule in the wafer foundry

M. A. Chik, Ibrahim Ahmad, Mohd. Yusoff Jamaluddin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper focusing on the method to measures the application of dispatching role in the wafer foundry. This is because dispatching rule play a critical rote to determine the success of higher throughput, mimmum cycle time, corresponded to turn ration of the WIP level and meeting on time delivery. In the imptementation, it uses Advanced Productivity Family (APF), comntercial software that integrated with Manufacturing Execution System (MES) for algorithm computational to calcalate the compliances of the dispatching rule that is applied is the wafer foundry manufacturing shop floor. From the literature review, It is believed that until now there is nun-formal measurement is being done to measure lhe compliance of the dispatching rule to wafer processing complexity. This result will help to measure 100% of the compliance of the dispatching rule for the success of the implementation of any dispatching system in assy wafer fabrication facilities. This implementation has successfully implemented in the real wafer fabrication.

Original languageEnglish
Title of host publicationProceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics
Pages642-644
Number of pages3
Publication statusPublished - 2004
Event2004 IEEE International Conference on Semiconductor Electronics, ICSE 2004 - Kuala Lumpur
Duration: 4 Dec 20049 Dec 2004

Other

Other2004 IEEE International Conference on Semiconductor Electronics, ICSE 2004
CityKuala Lumpur
Period4/12/049/12/04

Fingerprint

Foundries
Fabrication
Productivity
Throughput
Processing
Compliance

Keywords

  • Advanced productivity Family (APF)
  • Manufacturing Execution (MES)
  • Real Time Dispatch (RTO)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Chik, M. A., Ahmad, I., & Jamaluddin, M. Y. (2004). An alternative approach to measures the application of dispatching rule in the wafer foundry. In Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics (pp. 642-644). [1620968]

An alternative approach to measures the application of dispatching rule in the wafer foundry. / Chik, M. A.; Ahmad, Ibrahim; Jamaluddin, Mohd. Yusoff.

Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics. 2004. p. 642-644 1620968.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chik, MA, Ahmad, I & Jamaluddin, MY 2004, An alternative approach to measures the application of dispatching rule in the wafer foundry. in Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics., 1620968, pp. 642-644, 2004 IEEE International Conference on Semiconductor Electronics, ICSE 2004, Kuala Lumpur, 4/12/04.
Chik MA, Ahmad I, Jamaluddin MY. An alternative approach to measures the application of dispatching rule in the wafer foundry. In Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics. 2004. p. 642-644. 1620968
Chik, M. A. ; Ahmad, Ibrahim ; Jamaluddin, Mohd. Yusoff. / An alternative approach to measures the application of dispatching rule in the wafer foundry. Proceedings ICSE 2004 - 2004 IEEE International Conference on Semiconductor Electronics. 2004. pp. 642-644
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