A realistic march- 12N test and diagnosis algorithm for SRAM memories

Wan Zuha Wan Hasan, Masuri Othman, Bambang Sunaryo Suparjo

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)

    Abstract

    Testing and diagnosis techniques play a key role during the advance of semiconductor memory technologies. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and yield improvement. The test and diagnosis complexity are 12N for bit-oriented diagnosis algorithm, N is the number of addresses is proposed for fault detection and diagnosis. Using the proposed march-based algorithm (march-12N), 100% of the faults under the fault model are covered and partial distinguished. They also can locate the faulty cells and identify their types. The complete fault and diagnosis procedures for state coupling faults, idempotent coupling faults and inversion coupling faults are written in this paper. Therefore, all the coupling faults that occur in SRAM memories are verified and proved the valid results. Furthermore, the realistic 12N test and diagnosis algorithm has shown the improvement of diagnostic resolution and test time.

    Original languageEnglish
    Title of host publicationIEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
    Pages919-923
    Number of pages5
    DOIs
    Publication statusPublished - 2006
    Event2006 IEEE International Conference on Semiconductor Electronics, ICSE 2006 - Kuala Lumpur
    Duration: 29 Nov 20061 Dec 2006

    Other

    Other2006 IEEE International Conference on Semiconductor Electronics, ICSE 2006
    CityKuala Lumpur
    Period29/11/061/12/06

    Fingerprint

    Static random access storage
    Data storage equipment
    Testing
    Fault detection
    Failure analysis
    Semiconductor materials

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Hasan, W. Z. W., Othman, M., & Suparjo, B. S. (2006). A realistic march- 12N test and diagnosis algorithm for SRAM memories. In IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE (pp. 919-923). [4266756] https://doi.org/10.1109/SMELEC.2006.380773

    A realistic march- 12N test and diagnosis algorithm for SRAM memories. / Hasan, Wan Zuha Wan; Othman, Masuri; Suparjo, Bambang Sunaryo.

    IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. 2006. p. 919-923 4266756.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Hasan, WZW, Othman, M & Suparjo, BS 2006, A realistic march- 12N test and diagnosis algorithm for SRAM memories. in IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE., 4266756, pp. 919-923, 2006 IEEE International Conference on Semiconductor Electronics, ICSE 2006, Kuala Lumpur, 29/11/06. https://doi.org/10.1109/SMELEC.2006.380773
    Hasan WZW, Othman M, Suparjo BS. A realistic march- 12N test and diagnosis algorithm for SRAM memories. In IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. 2006. p. 919-923. 4266756 https://doi.org/10.1109/SMELEC.2006.380773
    Hasan, Wan Zuha Wan ; Othman, Masuri ; Suparjo, Bambang Sunaryo. / A realistic march- 12N test and diagnosis algorithm for SRAM memories. IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE. 2006. pp. 919-923
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