A new approach for combining yield and performance in behavioural models for analogue integrated circuits

Sawal Hamid Md Ali, Reuben Wilcock, Peter Wilson, Andrew Brown

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

A new algorithm is presented that combines performance and variation objectives in a behavioural model for a given analogue circuit topology and process. The tradeoffs between performance and yield are analysed using a combination of a multi-objective evolutionary algorithm and Monte Carlo simulation. The results indicate a significant improvement in overall simulation time and efficiency compared to conventional simulation based approaches, without a corresponding drop in accuracy. This approach is particularly useful in the hierarchical design of large and complex circuits where computational overheads are often prohibitive. The behavioural model has been developed in Verilog-A and tested extensively with practical designs using the Spectre™ simulator. A benchmark OTA circuit was used to demonstrate the proposed algorithm and the behaviour has been verified with transistor level simulations of this circuit and a higher level filter design. This has demonstrated that an accurate performance and yield prediction can be achieved using this model, in a fraction of the time of conventional simulation based methods.

Original languageEnglish
Title of host publicationProceedings -Design, Automation and Test in Europe, DATE
Pages152-157
Number of pages6
DOIs
Publication statusPublished - 2008
Externally publishedYes
EventDesign, Automation and Test in Europe, DATE 2008 - Munich
Duration: 10 Mar 200814 Mar 2008

Other

OtherDesign, Automation and Test in Europe, DATE 2008
CityMunich
Period10/3/0814/3/08

Fingerprint

Networks (circuits)
Computer hardware description languages
Electric network topology
Analog circuits
Evolutionary algorithms
Transistors
Simulators
Analog integrated circuits
Monte Carlo simulation

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Md Ali, S. H., Wilcock, R., Wilson, P., & Brown, A. (2008). A new approach for combining yield and performance in behavioural models for analogue integrated circuits. In Proceedings -Design, Automation and Test in Europe, DATE (pp. 152-157). [4484678] https://doi.org/10.1109/DATE.2008.4484678

A new approach for combining yield and performance in behavioural models for analogue integrated circuits. / Md Ali, Sawal Hamid; Wilcock, Reuben; Wilson, Peter; Brown, Andrew.

Proceedings -Design, Automation and Test in Europe, DATE. 2008. p. 152-157 4484678.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Md Ali, SH, Wilcock, R, Wilson, P & Brown, A 2008, A new approach for combining yield and performance in behavioural models for analogue integrated circuits. in Proceedings -Design, Automation and Test in Europe, DATE., 4484678, pp. 152-157, Design, Automation and Test in Europe, DATE 2008, Munich, 10/3/08. https://doi.org/10.1109/DATE.2008.4484678
Md Ali SH, Wilcock R, Wilson P, Brown A. A new approach for combining yield and performance in behavioural models for analogue integrated circuits. In Proceedings -Design, Automation and Test in Europe, DATE. 2008. p. 152-157. 4484678 https://doi.org/10.1109/DATE.2008.4484678
Md Ali, Sawal Hamid ; Wilcock, Reuben ; Wilson, Peter ; Brown, Andrew. / A new approach for combining yield and performance in behavioural models for analogue integrated circuits. Proceedings -Design, Automation and Test in Europe, DATE. 2008. pp. 152-157
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