A fault syndromes simulator for Random Access Memories

Wan Zuha Wan Hasan, Izhal Abdul Halin, Roslina Sidek, Masuri Othman

    Research output: Contribution to journalArticle

    2 Citations (Scopus)

    Abstract

    Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, the March test algorithm is used to detect and diagnose all faults related to Random Access Memories. This algorithm also allows the faults to be located and identified. However, the test and diagnosis process is mainly done manually. Due to this, a systematic approach for developing and evaluating memory test algorithm is required. This work is focused on incorporating the March based test algorithm using a software simulator tool for implementing a fast and systematic memory testing algorithm. The simulator allows a user through a GUI to select a March based test algorithm depending on the desired fault coverage and diagnostic resolution. Experimental results show that using the simulator for testing is more efficient than that of the traditional testing algorithm. This new simulator makes it possible for a detailed list of coupling faults and stuck-at faults covered by each algorithm and its percentage to be displayed after a set of test algorithms has been chosen. The percentage of diagnostic resolution is also displayed. This proves that the simulator reduces the trade-off between test time, fault coverage and diagnostic resolution. Moreover, the chosen algorithm can be applied to incorporate with memory built-in self-test and diagnosis, to have a better fault coverage and diagnostic resolution. Universities and industry involved in memory Built-in-Self test, Built-in-Self repair and Built-in-Self diagnose will benefit by saving a few years on finding an efficient algorithm to be implemented in their designs.

    Original languageEnglish
    Pages (from-to)13-24
    Number of pages12
    JournalEuropean Journal of Scientific Research
    Volume23
    Issue number1
    Publication statusPublished - 2008

    Fingerprint

    Random Access
    simulator
    Simulator
    Fault
    Simulators
    Data storage equipment
    Diagnostics
    testing
    application coverage
    Coverage
    Testing
    Built-in Self-test
    Built-in self test
    Percentage
    Failure Detection
    test
    Semiconductors
    semiconductors
    Graphical user interfaces
    Repair

    Keywords

    • Automated march-based test algorithm
    • Built-in self-test (BIST) Built-in self-diagnosis (BISD)
    • Coupling faults
    • Diagnosis
    • SRAM
    • Stuck-at faults march test algorithm
    • Testing

    ASJC Scopus subject areas

    • General

    Cite this

    Hasan, W. Z. W., Halin, I. A., Sidek, R., & Othman, M. (2008). A fault syndromes simulator for Random Access Memories. European Journal of Scientific Research, 23(1), 13-24.

    A fault syndromes simulator for Random Access Memories. / Hasan, Wan Zuha Wan; Halin, Izhal Abdul; Sidek, Roslina; Othman, Masuri.

    In: European Journal of Scientific Research, Vol. 23, No. 1, 2008, p. 13-24.

    Research output: Contribution to journalArticle

    Hasan, WZW, Halin, IA, Sidek, R & Othman, M 2008, 'A fault syndromes simulator for Random Access Memories', European Journal of Scientific Research, vol. 23, no. 1, pp. 13-24.
    Hasan, Wan Zuha Wan ; Halin, Izhal Abdul ; Sidek, Roslina ; Othman, Masuri. / A fault syndromes simulator for Random Access Memories. In: European Journal of Scientific Research. 2008 ; Vol. 23, No. 1. pp. 13-24.
    @article{d2ff048996d542dfa82fea9091980354,
    title = "A fault syndromes simulator for Random Access Memories",
    abstract = "Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, the March test algorithm is used to detect and diagnose all faults related to Random Access Memories. This algorithm also allows the faults to be located and identified. However, the test and diagnosis process is mainly done manually. Due to this, a systematic approach for developing and evaluating memory test algorithm is required. This work is focused on incorporating the March based test algorithm using a software simulator tool for implementing a fast and systematic memory testing algorithm. The simulator allows a user through a GUI to select a March based test algorithm depending on the desired fault coverage and diagnostic resolution. Experimental results show that using the simulator for testing is more efficient than that of the traditional testing algorithm. This new simulator makes it possible for a detailed list of coupling faults and stuck-at faults covered by each algorithm and its percentage to be displayed after a set of test algorithms has been chosen. The percentage of diagnostic resolution is also displayed. This proves that the simulator reduces the trade-off between test time, fault coverage and diagnostic resolution. Moreover, the chosen algorithm can be applied to incorporate with memory built-in self-test and diagnosis, to have a better fault coverage and diagnostic resolution. Universities and industry involved in memory Built-in-Self test, Built-in-Self repair and Built-in-Self diagnose will benefit by saving a few years on finding an efficient algorithm to be implemented in their designs.",
    keywords = "Automated march-based test algorithm, Built-in self-test (BIST) Built-in self-diagnosis (BISD), Coupling faults, Diagnosis, SRAM, Stuck-at faults march test algorithm, Testing",
    author = "Hasan, {Wan Zuha Wan} and Halin, {Izhal Abdul} and Roslina Sidek and Masuri Othman",
    year = "2008",
    language = "English",
    volume = "23",
    pages = "13--24",
    journal = "European Journal of Scientific Research",
    issn = "1450-202X",
    publisher = "European Journals Inc.",
    number = "1",

    }

    TY - JOUR

    T1 - A fault syndromes simulator for Random Access Memories

    AU - Hasan, Wan Zuha Wan

    AU - Halin, Izhal Abdul

    AU - Sidek, Roslina

    AU - Othman, Masuri

    PY - 2008

    Y1 - 2008

    N2 - Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, the March test algorithm is used to detect and diagnose all faults related to Random Access Memories. This algorithm also allows the faults to be located and identified. However, the test and diagnosis process is mainly done manually. Due to this, a systematic approach for developing and evaluating memory test algorithm is required. This work is focused on incorporating the March based test algorithm using a software simulator tool for implementing a fast and systematic memory testing algorithm. The simulator allows a user through a GUI to select a March based test algorithm depending on the desired fault coverage and diagnostic resolution. Experimental results show that using the simulator for testing is more efficient than that of the traditional testing algorithm. This new simulator makes it possible for a detailed list of coupling faults and stuck-at faults covered by each algorithm and its percentage to be displayed after a set of test algorithms has been chosen. The percentage of diagnostic resolution is also displayed. This proves that the simulator reduces the trade-off between test time, fault coverage and diagnostic resolution. Moreover, the chosen algorithm can be applied to incorporate with memory built-in self-test and diagnosis, to have a better fault coverage and diagnostic resolution. Universities and industry involved in memory Built-in-Self test, Built-in-Self repair and Built-in-Self diagnose will benefit by saving a few years on finding an efficient algorithm to be implemented in their designs.

    AB - Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, the March test algorithm is used to detect and diagnose all faults related to Random Access Memories. This algorithm also allows the faults to be located and identified. However, the test and diagnosis process is mainly done manually. Due to this, a systematic approach for developing and evaluating memory test algorithm is required. This work is focused on incorporating the March based test algorithm using a software simulator tool for implementing a fast and systematic memory testing algorithm. The simulator allows a user through a GUI to select a March based test algorithm depending on the desired fault coverage and diagnostic resolution. Experimental results show that using the simulator for testing is more efficient than that of the traditional testing algorithm. This new simulator makes it possible for a detailed list of coupling faults and stuck-at faults covered by each algorithm and its percentage to be displayed after a set of test algorithms has been chosen. The percentage of diagnostic resolution is also displayed. This proves that the simulator reduces the trade-off between test time, fault coverage and diagnostic resolution. Moreover, the chosen algorithm can be applied to incorporate with memory built-in self-test and diagnosis, to have a better fault coverage and diagnostic resolution. Universities and industry involved in memory Built-in-Self test, Built-in-Self repair and Built-in-Self diagnose will benefit by saving a few years on finding an efficient algorithm to be implemented in their designs.

    KW - Automated march-based test algorithm

    KW - Built-in self-test (BIST) Built-in self-diagnosis (BISD)

    KW - Coupling faults

    KW - Diagnosis

    KW - SRAM

    KW - Stuck-at faults march test algorithm

    KW - Testing

    UR - http://www.scopus.com/inward/record.url?scp=65449123170&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=65449123170&partnerID=8YFLogxK

    M3 - Article

    AN - SCOPUS:65449123170

    VL - 23

    SP - 13

    EP - 24

    JO - European Journal of Scientific Research

    JF - European Journal of Scientific Research

    SN - 1450-202X

    IS - 1

    ER -