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Research Output 2007 2017

  • 255 Citations
  • 8 h-Index
  • 17 Conference contribution
  • 13 Article
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Conference contribution
2016
1 Citation (Scopus)

A multiband 130nm CMOS low noise amplifier for LTE bands

Kamsani, N. A., Thangasamy, V., Bukhori, M. F. & Shafie, S., 27 Jan 2016, Proceeding - 2015 IEEE International Circuits and Systems Symposium, ICSyS 2015. Institute of Electrical and Electronics Engineers Inc., p. 106-110 5 p. 7394074

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Low noise amplifiers
local thermodynamic equilibrium
low noise
CMOS
amplifiers

A multiband 130nm CMOS second order band pass filter for LTE bands

Kamsani, N. A., Thangasamy, V., Bukhori, M. F. & Shafie, S., 27 Jan 2016, Proceeding - 2015 IEEE International Circuits and Systems Symposium, ICSyS 2015. Institute of Electrical and Electronics Engineers Inc., p. 100-105 6 p. 7394073

Research output: Chapter in Book/Report/Conference proceedingConference contribution

local thermodynamic equilibrium
Bandpass filters
bandpass filters
Resonant circuits
CMOS

Multimode multiband power amplifier with tapped transformer for efficiency enhancement in low power mode

Thangasamy, V., Thiruchelvam, V., Hamidon, M. N., Hashim, S. J., Bukhori, M. F., Yusoff, Z. & Kamsani, N. A., 21 Sep 2016, 2016 IEEE International Conference on Semiconductor Electronics, ICSE 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., Vol. 2016-September. p. 268-271 4 p. 7573643

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Power amplifiers
Transistors
Bandwidth
Smartphones
2 Citations (Scopus)

Wireless power transfer with on-chip inductor and class-E power amplifier for implant medical device applications

Thangasamy, V., Kamsani, N. A., Thiruchelvam, V., Hamidon, M. N., Hashim, S. J., Bukhori, M. F. & Yusoff, Z., 7 Apr 2016, 2015 IEEE Student Conference on Research and Development, SCOReD 2015. Institute of Electrical and Electronics Engineers Inc., p. 422-426 5 p. 7449370

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Power amplifiers
Pacemakers
Piercing
Brain computer interface
Orthopedics
2015
6 Citations (Scopus)

A low power multiplexer based pass transistor logic full adder

Kamsani, N. A., Thangasamy, V., Hashim, S. J., Yusoff, Z., Bukhori, M. F. & Hamidon, M. N., 11 Dec 2015, RSM 2015 - 2015 IEEE Regional Symposium on Micro and Nano Electronics, Proceedings. Institute of Electrical and Electronics Engineers Inc., 7354994

Research output: Chapter in Book/Report/Conference proceedingConference contribution

transistor logic
Adders
adding circuits
Transistors
electric potential
2 Citations (Scopus)

Characterization of NBTI-induced positive charges in 16 nm FinFET

Hussin, H., Soin, N., Wan Muhamad Hatta, S. & Bukhori, M. F., 30 Sep 2015, Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015. Institute of Electrical and Electronics Engineers Inc., p. 365-368 4 p. 7285126

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Charge density
Hole traps
Threshold voltage
Electron energy levels
Energy gap

Impact of different NBTI defect components on sub-threshold operation of high-k p-MOSFET

Hussin, H., Soin, N., Muhamad Hatta, S. W. & Bukhori, M. F., 19 Nov 2015, IOP Conference Series: Materials Science and Engineering. 1 ed. Institute of Physics Publishing, Vol. 99. 012015

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Defects
MOSFET devices
Threshold voltage
Degradation
4-nitrobenzylthioinosine
2014

Effects of sub-threshold operation on 32 nm technology node PMOSFETs evaluated from the perspective of 2-stage NBTI model

Hussin, H., Soin, N. & Bukhori, M. F., 2014, Technical Proceedings of the 2014 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2014. Nano Science and Technology Institute, Vol. 2. p. 463-466 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Threshold voltage
Transistors
Oxides
4-nitrobenzylthioinosine
Negative bias temperature instability

Promising integrated two-stage NBTI model for accurate lifetime prediction of nano-scale HKMG PMOSFETs

Hussin, H., Soin, N. & Bukhori, M. F., 2014, Technical Proceedings of the 2014 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2014. Nano Science and Technology Institute, Vol. 2. p. 467-470 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Degradation
Defects
Electric potential
Electron energy levels
Temperature
2013

A study using two stage NBTI model for 32 nm high-k PMOSFET

Hussin, H., Muhamad, M., Abdul Wahab, Y., Shahabuddin, S., Soin, N. & Bukhori, M. F., 2013, 2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013. 6628108

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kinetics
Hole traps
Energy barriers
Threshold voltage
Passivation
2012
59 Citations (Scopus)

Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs

Franco, J., Kaczer, B., Toledano-Luque, M., Roussel, P. J., Mitard, J., Ragnarsson, L. Å., Witters, L., Chiarella, T., Togo, M., Horiguchi, N., Groeseneken, G., Bukhori, M. F., Grasser, T. & Asenov, A., 2012, IEEE International Reliability Physics Symposium Proceedings. 6241841

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Field effect transistors
Defects
Oxides
Transistors
Doping (additives)
31 Citations (Scopus)

The relevance of deeply-scaled FET threshold voltage shifts for operation lifetimes

Kaczer, B., Franco, J., Toledano-Luque, M., Roussel, P. J., Bukhori, M. F., Asenov, A., Schwarz, B., Bina, M., Grasser, T. & Groeseneken, G., 2012, IEEE International Reliability Physics Symposium Proceedings. 6241839

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Field effect transistors
Threshold voltage
Circuit simulation
Doping (additives)
Degradation
2010
8 Citations (Scopus)

'Atomistic' simulation of RTS amplitudes due to single and multiple charged defect states and their interactions

Bukhori, M. F., Grasser, T., Kaczer, B., Hans, R. & Asenov, A., 2010, IEEE International Integrated Reliability Workshop Final Report. p. 76-79 4 p. 5706490

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Defects
Critical currents
Doping (additives)
Electric potential
2009
14 Citations (Scopus)

Simulation of statistical aspects of reliability in nano CMOS transistors

Bukhori, M. F., Brown, A. R., Roy, S. & Asenov, A., 2009, IEEE International Integrated Reliability Workshop Final Report. p. 82-85 4 p. 5383028

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Transistors
Charge trapping
Threshold voltage
Doping (additives)
Defects
2008
31 Citations (Scopus)

Advanced simulation of statistical variability and reliability in nano CMOS transistors

Asenov, A., Roy, S., Brown, R. A., Roy, G., Alexander, C., Riddet, C., Millar, C., Cheng, B., Martinez, A., Seoane, N., Reid, D., Bukhori, M. F., Wang, X. & Kovac, U., 2008, Technical Digest - International Electron Devices Meeting, IEDM. 4796712

Research output: Chapter in Book/Report/Conference proceedingConference contribution

CMOS
Transistors
transistors
simulation
1 Citation (Scopus)

Statistical simulation of RTS amplitude distribution in realistic bulk MOSFETs subject to random discreet dopants

Bukhori, M. F., Roy, S. & Asenov, A., 2008, ULIS 2008 - 9th International Conference on ULtimate Integration of Silicon. p. 171-174 4 p. 4527166

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Doping (additives)
Charge trapping
Threshold voltage
Geometry
Electrons
2007
1 Citation (Scopus)

OXADM: Feasibility of network security and migration

Ab Rahman, M. S., Ibrahim, W. N. W., Bukhori, M. F. & Shaari, S., 2007, 2007 Asia-Pacific Conference on Applied Electromagnetics Proceedings, APACE2007. 4603892

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Network security
Fiber optic networks
Restoration
Chemical activation
Topology